Tuesday, September 9
9:30 – 9:45 AM
Opening remarks Anna Osherov, Associate Director, Characterization.nano
Saima Sumaiya, Technical Account Manager, Bruker
9:45 – 10:30 AM
New AFM and AFM-IR Modes for 2D Materials, Multiferroics, and Quantum Computing Thomas Mueller, PhD, Sr. Director, AFMi, NanoIR, and Nanoindentation
10:30 – 10:45 AM
Break
11:00 – 11:45 AM
Electrical measurements in AFM: Focus on Piezoresponse (PFM) and Microwave Impedance (sMIM) Microscopy John Thornton, Sr. Applications Engineer
11:45 – 12:15 PM
IR beyond the diffraction limit: Introduction and Applications of Photothermal AFM-IR Jinhee Kim, Ph.D., NanoIR Applications Scientist
12:15 – 1:00 PM
Lunch
1:00 – 5:00 PM
Hands-on session (Bruker Dimension Icon) Separate registration required (limited to 5 individuals)
Wednesday, September 10
9:00 – 9:30 AM
Application of Large Area Mapping and High-Resolution Correlative Imaging with AFM for Automated Structural and Nanomechanical Analysis in Tissues, Cells, Biomolecules, and Materials Research Yi Wei, Ph.D., Applications Scientist
9:30 – 10:00 AM
Nanomechanical Testing Developments for High Throughput and Extreme Environments Michael Berg, Nanoindentation Product Specialist
10:00 – 10:15 AM
Break
10:15 – 11:15 AM
Virtual demonstration of Bruker's state-of-the-art standalone Nanoindenter: TI-990 11:15 – 11:45 AM
Virtual demonstration of Bruker's SEM Picoindenter: PI-89 11:45 – 1:00 PM
Lunch
1:00 – 5:00 PM
Hands-on session (Bruker Dimension Icon) Separate registration required (limited to 5 individuals)