Characterization User Forum: Spotlight on X-ray diffraction

Wednesday, November 19, 4:00pm - 5:00pm (EST)

Time shown in-05:00 America, New York

Applying high-resolution X-ray diffraction to far from equilibrium films and novel III-V alloys

John McElearney, Research Scientist
Epitaxial Core Facility, Tufts University

Abstract
Our group specializes in growing far from equilibrium films for use in infrared optoelectronics, specifically III-V-Bi and Tl-III-V alloys. In each case, dilute alloying can have a dramatic impact on the host band structure, enabling new band gap and lattice constant combinations. From both a materials and device perspective, precise control of alloy composition and strain state is paramount; luckily, high-resolution x-ray diffraction offers a powerful method of probing both. More recently, students in our facility have begun looking at films grown along the (111) crystalline direction, introducing unique challenges to growth and HRXRD analysis.

Biography
John McElearney is a research scientist at the Epitaxial Core Facility at Tufts University. His work focuses on the growth and characterization of novel III-V alloys for use in infrared optoelectronics.

See the event webpage: https://mitnano.mit.edu/events/characterization-user-forum-McElearney

Add to Calendar 2025/11/19 16:00:00 2025/11/19 17:00:00 America/New_York Characterization User Forum: Spotlight on X-ray diffraction Applying high-resolution X-ray diffraction to far from equilibrium films and novel III-V alloys

John McElearney, Research Scientist
Epitaxial Core Facility, Tufts University

Abstract
Our group specializes in growing far from equilibrium films for use in infrared optoelectronics, specifically III-V-Bi and Tl-III-V alloys. In each case, dilute alloying can have a dramatic impact on the host band structure, enabling new band gap and lattice constant combinations. From both a materials and device perspective, precise control of alloy composition and strain state is paramount; luckily, high-resolution x-ray diffraction offers a powerful method of probing both. More recently, students in our facility have begun looking at films grown along the (111) crystalline direction, introducing unique challenges to growth and HRXRD analysis.

Biography
John McElearney is a research scientist at the Epitaxial Core Facility at Tufts University. His work focuses on the growth and characterization of novel III-V alloys for use in infrared optoelectronics.

See the event webpage: https://mitnano.mit.edu/events/characterization-user-forum-McElearney 12-0168 false MM/DD/YYYY 30 OPAQUE ecc7a70de8bc40a0861fa5ec627d9524

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MITnano, mitnano@mit.edu

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