Thursday, January 26, 12:30pm - 1:00pm (EST)
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Inspection technologies have evolved in recent years beyond visual comparison techniques to include metrology and sophisticated data-driven process and line control systems. This panel will discuss recent developments and the challenges of miniaturization.
Brian D'Amico, President & CEO at MIRTEC Corporation
Joel Scutchfield, General Manager at Koh Young Americas
Craig Brown, Sales Manager - USA & Canada, SAKI Corporation
Trevor Galbraith, firstname.lastname@example.org
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